On the Value of Oversampling for Deep Learning in Software Defect Prediction.
Rahul YedidaTim MenziesPublished in: IEEE Trans. Software Eng. (2022)
Keyphrases
- deep learning
- software defect prediction
- class imbalance
- active learning
- class distribution
- imbalanced data
- unsupervised learning
- cost sensitive
- ensemble learning
- machine learning
- cost sensitive learning
- minority class
- feature selection
- concept drift
- feature ranking
- high dimensionality
- mental models
- sampling methods
- weakly supervised
- sample selection bias
- misclassification costs
- image classification
- classification accuracy
- support vector machine
- training set
- data mining
- semi supervised
- text categorization