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A Single Input Change Test Pattern Generator for Sequential Circuits.

Feng LiangShaochong LeiZhibiao Shao
Published in: IEICE Trans. Electron. (2008)
Keyphrases
  • pattern generator
  • image analysis
  • input data
  • database
  • real time
  • learning algorithm
  • information systems
  • high speed
  • object boundaries
  • statistical significance
  • user input