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Test Data Generation for Event-B Models Using Genetic Algorithms.

Ionut DincaAlin StefanescuFlorentin IpateRaluca LefticaruCristina Tudose
Published in: ICSECS (3) (2011)
Keyphrases
  • test data generation
  • real world
  • case study
  • search based testing
  • artificial neural networks
  • reverse engineering
  • simulated annealing algorithm
  • test case generation