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Combining Sampling and Synopses with Worst-Case Optimal Runtime and Quality Guarantees for Graph Pattern Cardinality Estimation.
Kyoungmin Kim
Hyeonji Kim
George Fletcher
Wook-Shin Han
Published in:
SIGMOD Conference (2021)
Keyphrases
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worst case
cardinality estimation
query optimization
wavelet synopses
error bounds
quality guarantees
graph patterns
cost estimation
dynamic programming
database systems
optimal solution
error metrics
data distribution
graph mining
database
object oriented
data sets