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Mitigating Aperture Error in Pipelined ADCs Without a Front-end Sample-and-Hold Amplfier.

Diego JamesAbishek T. KunnathA. PurushothamanBibhudatta Sahoo
Published in: VLSI Design (2018)
Keyphrases
  • error rate
  • back end
  • website
  • data flow
  • error analysis
  • small sample
  • linear complexity
  • real time
  • databases
  • three dimensional
  • database systems
  • video sequences
  • active learning
  • relative error