On the Extraction of Pattern Features from Continuous Measurements.
Arvind CaprihanRui J. P. de FigueiredoPublished in: IEEE Trans. Syst. Sci. Cybern. (1970)
Keyphrases
- automatically extracted
- key features
- pattern matching
- feature set
- image features
- feature space
- low level
- image processing
- feature extraction
- database
- keypoints
- machine learning
- features extraction
- pattern extraction
- automatic extraction
- extracted features
- structural information
- false positives
- co occurrence
- classification accuracy
- image retrieval
- object recognition
- information retrieval