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Object Depth Estimation From Line-Scan EMI Data Using Machine Learning.

Marko SimicDavorin AmbrusVedran Bilas
Published in: IEEE SENSORS (2022)
Keyphrases
  • machine learning
  • data sets
  • high quality
  • training data
  • data points
  • d objects
  • depth map
  • feature space
  • optical flow
  • stereo matching
  • spectral clustering
  • depth estimation