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Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement.
Karen Taylor
Bryan Nelson
Alan Chong
Henry C. Lin
Eddie Chan
Mani Soma
Hosam Haggag
Jeff Huard
Jim Braatz
Published in:
IEEE Trans. Instrum. Meas. (2005)
Keyphrases
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special issue
high speed
low power
real time
ecml pkdd
ai edam
analog to digital converter
international journal
applied intelligence
management system
shift register
analog vlsi
frame rate
random access memory
low cost
special section
packet loss
cmos technology