Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability.
Anteneh GebregiorgisMehdi Baradaran TahooriPublished in: DATE (2019)
Keyphrases
- boolean satisfiability
- sat solvers
- probabilistic planning
- boolean optimization
- branch and bound algorithm
- sat problem
- randomly generated
- integer linear programming
- sat solving
- maximum satisfiability
- symmetry breaking
- max sat
- random sat instances
- sat instances
- combinatorial problems
- phase transition
- planning problems
- computational complexity
- constraint satisfaction