Optimal single probe traversal algorithm for testing of MCM substrat.
Rajesh PendurkarAbhijit ChatterjeeCraig A. ToveyPublished in: ICCD (1996)
Keyphrases
- dynamic programming
- preprocessing
- worst case
- learning algorithm
- computational cost
- optimal solution
- globally optimal
- tree structure
- matching algorithm
- closed form
- times faster
- experimental evaluation
- detection algorithm
- classification algorithm
- segmentation algorithm
- improved algorithm
- convergence rate
- search space
- computational complexity
- data structure
- objective function
- similarity measure
- upper bound
- piecewise linear
- optimal path
- locally optimal
- input data
- cost function
- significant improvement
- k means
- decision trees