Computational Intelligence Characterization Method of Semiconductor Device
Eric LiauDoris Schmitt-LandsiedelPublished in: CoRR (2007)
Keyphrases
- computational intelligence
- high precision
- computational cost
- support vector machine
- similarity measure
- pairwise
- experimental evaluation
- decision trees
- synthetic data
- clustering method
- high accuracy
- artificial neural networks
- preprocessing
- input data
- optimization algorithm
- classification method
- neural network
- fully automatic