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Design and Comparison of High-Reliable Radiation-Hardened Flip-Flops Under SMIC 40nm Process.

Bingbing XiaJun WuHongjin LiuKai ZhouZhifu Miao
Published in: J. Circuits Syst. Comput. (2016)
Keyphrases
  • design process
  • x ray
  • conceptual model
  • input output
  • pattern recognition
  • relational databases
  • hidden markov models
  • digital images
  • design methodology
  • massively parallel