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Design and Comparison of High-Reliable Radiation-Hardened Flip-Flops Under SMIC 40nm Process.
Bingbing Xia
Jun Wu
Hongjin Liu
Kai Zhou
Zhifu Miao
Published in:
J. Circuits Syst. Comput. (2016)
Keyphrases
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design process
x ray
conceptual model
input output
pattern recognition
relational databases
hidden markov models
digital images
design methodology
massively parallel