An efficient algorithm for modeling spatially-correlated process variation in statistical full-chip leakage analysis.
Zuochang YeZhiping YuPublished in: ICCAD (2009)
Keyphrases
- statistical analysis
- high accuracy
- dynamic programming
- detection algorithm
- optimal solution
- optimization algorithm
- experimental evaluation
- optimization process
- search space
- learning algorithm
- np hard
- cost function
- computational cost
- preprocessing
- matching process
- computational complexity
- spatially correlated
- contingency tables
- statistical modeling
- neural network
- times faster
- computationally efficient
- particle swarm optimization
- worst case
- probabilistic model
- significant improvement