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A Comprehensive Approach to Misspelling Correction with BERT and Levenshtein Distance.

Amirreza NaziriHossein Zeinali
Published in: CoRR (2024)
Keyphrases
  • levenshtein distance
  • edit distance
  • visual analysis
  • similarity measure
  • scan path
  • computer vision
  • feature selection
  • pattern recognition
  • infrared
  • pattern mining
  • information visualization