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Telecontrol of Ultra-High Voltage Electron Microscope over Global IPv6 Network.

Toyokazu AkiyamaShinji ShimojoShojiro NishioYoshinori KitatsujiSteven PeltierThomas HuttonFang-Pang Lin
Published in: SAINT Workshops (2003)
Keyphrases
  • high voltage
  • electron microscope
  • operating conditions
  • three dimensional
  • partial discharge
  • genetic algorithm
  • image segmentation
  • artificial neural networks
  • decision support system
  • class labels