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Comparison of ELTs with different shapes and a regular layout transistor in 180 nm CMOS process.

Sadik IlikNergiz Sahin-SolmazAykut KabaogluMustafa Berke Yelten
Published in: SMACD (2019)
Keyphrases
  • high speed
  • statistical analysis
  • shape analysis
  • shape descriptors
  • shape representation
  • social networks
  • low power
  • shape recognition
  • genetic algorithm
  • line drawings
  • shape matching
  • integrated circuit
  • shape similarity