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Demonstration of High-Growth-Rate Epitaxially Grown Si Channel on 3D NAND Test Vehicle with Memory Functionality.

Hao-Ling TangInsoo JungFrank CC ChinLuc ThomasXin MengArvind KumarJaesoo AhnZuoming ZhuAbhishek DubeMahendra Pakala
Published in: IMW (2024)
Keyphrases
  • growth rate
  • flash memory
  • information technology
  • memory requirements
  • highly correlated
  • economic development
  • nearest neighbor
  • low cost
  • information retrieval systems
  • main memory
  • vehicle detection
  • storage devices