A method of automatic sizing logic driver of 16nm Fin-FET.
ZengFa PengJianbin ZhengAiLin ZhangPublished in: ASICON (2015)
Keyphrases
- fully automatic
- preprocessing
- high accuracy
- objective function
- high precision
- significant improvement
- multiscale
- classification method
- synthetic data
- computationally efficient
- input data
- classification accuracy
- computational cost
- computational complexity
- decision trees
- support vector machine
- optimization algorithm
- detection algorithm
- clustering method
- semi automatic
- pairwise
- numerical simulations