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A 0.55 THz Near-Field Sensor With a µm-Range Lateral Resolution Fully Integrated in 130 nm SiGe BiCMOS.

Janusz GrzybBernd HeinemannUllrich R. Pfeiffer
Published in: IEEE J. Solid State Circuits (2016)
Keyphrases
  • fully integrated
  • time of flight
  • high resolution
  • thin film
  • mixed signal
  • databases
  • database systems
  • data management
  • workflow management