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Analysis of deviation from Pelgrom scaling law in Vth variability of pocket-implanted MOSFET.

Kiyohiko SakakibaraYaichiro MiuraToshio KumamotoSusumu Tanimoto
Published in: CICC (2013)
Keyphrases
  • automatic analysis
  • pattern recognition
  • digital libraries
  • statistical analysis
  • quantitative analysis
  • data structure
  • data analysis
  • preprocessing
  • control system
  • case based reasoning