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Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test.

Blaise RaveloAlexandre DouyèreYang LiuWenceslas RahajandraibeFayu WanGeorge ChanMathieu Guerin
Published in: IEEE Des. Test (2023)
Keyphrases
  • microstrip
  • small size
  • bandpass
  • feature extraction
  • computational complexity
  • image enhancement