Deep Learning-Based Autonomous Scanning Electron Microscope.

Jonggyu Jang Hyeonsu Lyu Hyun Jong Yang Moohyun Oh Junhee Lee

Published in: IROS (2020)

Keyphrases

deep learning
scanning electron microscope
unsupervised learning
machine learning
unsupervised feature learning
mental models
weakly supervised
restricted boltzmann machine
data sets
viewpoint
deep architectures
active learning
generative model
deep belief networks