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APMP international comparison of AC-DC transfer standards at the lowest attainable level of uncertainty.

Ilya F. BudovskyAbdul Rashid Bin Zainal AbidinAaron Y. K. YanLingXiang LiuVijay Kumar RustagiAnil Kumar GovilManfred KlonzYih-cheng WeiMurray D. EarlyHitoshi SasakiHiroyuki FujikiChalit KumtaweeAjchara CharoensookSung-Won KwonNguyen Ahn SonBambang SupriantoMoses TembaManuel RuizSabino Paulo B. Leones Jr.
Published in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
  • international standard
  • database
  • lower level
  • widely accepted
  • levels of abstraction
  • inherent uncertainty
  • real time
  • neural network
  • optimal solution
  • statistical analysis