Pattern Recognition Based on Similarity in Linear Semi-ordered Spaces.
Juliusz L. KulikowskiMalgorzata PrzytulskaPublished in: HAIS (1) (2011)
Keyphrases
- pattern recognition
- similarity measure
- feature extraction
- machine learning
- computer vision
- image processing
- image analysis
- user defined
- euclidean distance
- distance measure
- data sets
- signal processing
- semantic similarity
- similarity metrics
- closed form
- similarity metric
- moment invariants
- linear constraints
- hilbert space