Yield improvement for GaAs IC manufacturing using neural network inverse modeling.

Jacek M. Zurada Andrzej Lozowski Aleksander Malinowski

Published in: ICNN (1997)

Keyphrases

neural network
artificial neural networks
neural network model
feedforward neural networks
feed forward
real time
back propagation
fuzzy logic
pattern recognition
training data
multilayer perceptron
manufacturing systems
training algorithm
multi layer perceptron
production planning
case study
injection lasers