Login / Signup

Generating Defective Epoxy Drop Images for Die Attachment in Integrated Circuit Manufacturing via Enhanced Loss Function CycleGAN.

Lamia AlamNasser Kehtarnavaz
Published in: Sensors (2023)
Keyphrases
  • loss function
  • integrated circuit
  • image classification
  • pairwise
  • image retrieval
  • support vector
  • image features
  • learning to rank
  • automatic annotation
  • risk minimization