Novel CMOS Scan Design for VLSI Testability.

Haomin Wu Nan Zhuang Marek A. Perkowski

Published in: ISMVL (1993)

Keyphrases

single chip
high speed
circuit design
chip design
data sets
user experience
optimal design
design tools
design methodology
case study
software architecture
design decisions
building blocks
expert systems
image sequences
information systems
vlsi circuits
neural network