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Total-ionization-dose characterization of a radiation-hardened mixed-signal microcontroller SoC in 180 nm CMOS technology for nanosatellites.

X. GeWen GaoFeng XuChen ZhaoYang ZhaoX. LiD. JiangH. LiuY. LiG. Sun
Published in: Microelectron. J. (2019)
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