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Total-ionization-dose characterization of a radiation-hardened mixed-signal microcontroller SoC in 180 nm CMOS technology for nanosatellites.
X. Ge
Wen Gao
Feng Xu
Chen Zhao
Yang Zhao
X. Li
D. Jiang
H. Liu
Y. Li
G. Sun
Published in:
Microelectron. J. (2019)
Keyphrases
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cmos technology
mixed signal
low power
low cost
single chip
power consumption
high speed
low voltage
small animal
x ray
hardware and software
treatment plan
power dissipation
image sensor
digital signal processing
silicon on insulator
parallel processing
real time
radiation doses
embedded systems
pattern recognition
digital camera