A Fast and Accurate Middle End of Line Parasitic Capacitance Extraction for MOSFET and FinFET Technologies Using Machine Learning.
Mohamed Saleh AbouelyazidSherif HammoudaYehea IsmailPublished in: ASP-DAC (2022)
Keyphrases
- machine learning
- information extraction
- learning systems
- data mining
- high accuracy
- machine learning methods
- unit length
- machine learning algorithms
- text mining
- computer science
- automatic extraction
- inductive learning
- artificial intelligence
- high speed
- pattern recognition
- learning paradigms
- learning problems
- computer vision
- active learning
- computational intelligence
- text classification
- semi supervised learning
- supervised learning
- wavelet transform
- knowledge base
- support vector machine
- knowledge discovery
- low power
- st century
- knowledge representation
- machine learning approaches
- automatically extracted
- reinforcement learning