An Area-Efficient High-Resolution Segmented ΣΔ-DAC for Built-In Self-Test Applications.
Ahmed S. EmaraDenis RomanovGordon W. RobertsSadok AouiniSoheyl ZiabakhshMahdi ParviziNaim Ben-HamidaPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2021)