Automated Low-Cost SBST Optimization Techniques for Processor Testing.

Vasudevan Madampu Suryasarman Santosh Biswas Aryabartta Sahu

Published in: VLSI Design (2021)

Keyphrases

low cost
single chip
search based testing
high speed
fully automated
low power
semi automated
real time
digital camera
hardware and software
computer aided
parallel processing
highly efficient
data acquisition
software testing
information systems
learning algorithm
neural network