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Exploring modeling and testing of NAND flash memories.

Stefano Di CarloMichele FabianoRoberto PiazzaPaolo Prinetto
Published in: EWDTS (2010)
Keyphrases
  • data sets
  • data mining
  • multiscale
  • machine learning
  • genetic algorithm
  • case study
  • data structure
  • management system
  • low cost
  • high speed
  • associative memory
  • software testing