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Gate oxide protection in HV CMOS/DMOS integrated circuits: Design and experimental results.

Robert ChebliMohamad SawanYvon Savaria
Published in: ICECS (2005)
Keyphrases
  • integrated circuit
  • metal oxide semiconductor
  • circuit design
  • cmos technology
  • real world
  • image processing
  • low cost
  • design process
  • experimental design
  • printed circuit boards
  • hardware description language
  • low power