Wafer map defect recognition based on deep transfer learning-based densely connected convolutional network and deep forest.
Jianbo YuZongli ShenShijin WangPublished in: Eng. Appl. Artif. Intell. (2021)
Keyphrases
- transfer learning
- knowledge transfer
- convolutional network
- convolutional neural networks
- cross domain
- object recognition
- reinforcement learning
- labeled data
- machine learning algorithms
- machine learning
- text classification
- active learning
- semi supervised learning
- text categorization
- graph mining
- target domain
- transfer knowledge
- collaborative filtering
- natural language processing
- object detection
- multi class
- natural language
- feature extraction
- computer vision