Three-layer Approach to Detect Anomalies in Industrial Environments based on Machine Learning.
Daniel Gutierrez-RojasMehar UllahIoannis T. ChristouGustavo AlmeidaPedro H. J. NardelliDick CarrilloJean Michel de Souza Sant'AnaHirley AlvesMerim DzaferagicAlessandro ChiumentoCharalampos KalalasPublished in: ICPS (2020)
Keyphrases
- machine learning
- detect anomalies
- anomaly detection
- pattern recognition
- machine learning methods
- multi layer
- machine learning algorithms
- computational intelligence
- neural network
- decision trees
- learning tasks
- statistical methods
- text mining
- real world
- learning methodologies
- information extraction
- knowledge discovery
- learning algorithm
- artificial intelligence
- feature selection
- industrial environment
- supervised learning
- technology transfer
- machine learning approaches
- robotic systems
- inductive learning
- natural language
- network traffic
- computer science
- data analysis
- learning systems
- active learning
- dynamic environments