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Race-Hazard and Skip-Hazard in Multivalued Combinational Circuits.

Xunwei WuXiexiong ChenJizhong Shen
Published in: ISMVL (1995)
Keyphrases
  • risk assessment
  • logic circuits
  • asynchronous circuits
  • social networks
  • high speed
  • real time
  • neural network
  • data mining
  • information retrieval
  • multiscale