Login / Signup

An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors.

Xhesila XhafaAli Dogus GüngördüDidem ErolYavuzhan YavuzMustafa Berke Yelten
Published in: IEEE Trans. Instrum. Meas. (2021)
Keyphrases
  • circuit design
  • power consumption
  • semi automated
  • genetic algorithm
  • real time
  • high speed
  • intra class
  • cmos technology