SB-PE drift-diffusion algorithm for FET devices global modeling.
Giorgio LeuzziVincenzo StornelliPublished in: Microelectron. J. (2013)
Keyphrases
- computational cost
- times faster
- dynamic programming
- preprocessing
- detection algorithm
- experimental evaluation
- learning algorithm
- objective function
- np hard
- probabilistic model
- high accuracy
- improved algorithm
- expectation maximization
- input data
- cost function
- optimal solution
- worst case
- simulated annealing
- wireless sensor networks
- particle swarm optimization
- k means
- convex hull
- similarity measure