Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors.
Peng ZhaoLei CaoFan ZhangHaoqing XuWeizhuo GanQingzhu ZhangZhaohao ZhangJiaxin YaoGuoliang TianKun LuoZhenhua WuHuaxiang YinPublished in: Microelectron. J. (2023)