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Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors.

Peng ZhaoLei CaoFan ZhangHaoqing XuWeizhuo GanQingzhu ZhangZhaohao ZhangJiaxin YaoGuoliang TianKun LuoZhenhua WuHuaxiang Yin
Published in: Microelectron. J. (2023)
Keyphrases
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  • steady state
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