• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS.

Haipeng ZhangLiang ZhangDejun WangGuohua LiuMi LinXiaoyan NiuLingyan Fan
Published in: APCCAS (2010)
Keyphrases
  • positive and negative
  • social networks
  • hidden markov models
  • neural network
  • feature selection
  • e learning
  • image processing
  • web services
  • decision trees
  • optimal solution
  • wireless sensor networks
  • high robustness