Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS.

Haipeng Zhang Liang Zhang Dejun Wang Guohua Liu Mi Lin Xiaoyan Niu Lingyan Fan

Published in: APCCAS (2010)

Keyphrases

positive and negative
social networks
hidden markov models
neural network
feature selection
e learning
image processing
web services
decision trees
optimal solution
wireless sensor networks
high robustness