N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors.

Chun-Hsien Liu Sheng-Di Lin

Published in: Sensors (2023)

Keyphrases

image sensor
visible spectrum
imaging systems
dynamic range
video camera
low power
image processing algorithms
hardware and software
digital camera
motion blur
infrared
low cost
computer vision