Sign in

Chip-level modeling and analysis of electrical masking of soft errors.

Saman KiamehrMojtaba EbrahimiFarshad FirouziMehdi Baradaran Tahoori
Published in: VTS (2013)
Keyphrases
  • high speed
  • error analysis
  • neural network
  • real time
  • image processing
  • website
  • data analysis
  • image analysis
  • evolutionary algorithm
  • low power
  • mathematical modeling