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Modeling and Fault Categorization in Thin-Film and Crystalline PV Arrays Through Multilayer Neural Network Algorithm.

Azhar Ul-HaqHatem SindiSaba GulMarium Jalal
Published in: IEEE Access (2020)
Keyphrases
  • thin film
  • learning algorithm
  • artificial intelligence
  • pattern recognition
  • feature extraction
  • probabilistic model
  • short circuit