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Characterization of Fe Micromagnets for Semiconductor Spintronics by In-Field Magnetic Force Microscopy.
Hannes S. Funk
David Weißhaupt
Daniel Schwarz
D. Bloos
Joris van Slageren
Jörg Schulze
Published in:
MIPRO (2021)
Keyphrases
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image analysis
high throughput
finite element
magnetic field
information retrieval
computer vision
information systems
case study
pattern recognition
position control