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Characterization of Fe Micromagnets for Semiconductor Spintronics by In-Field Magnetic Force Microscopy.

Hannes S. FunkDavid WeißhauptDaniel SchwarzD. BloosJoris van SlagerenJörg Schulze
Published in: MIPRO (2021)
Keyphrases
  • image analysis
  • high throughput
  • finite element
  • magnetic field
  • information retrieval
  • computer vision
  • information systems
  • case study
  • pattern recognition
  • position control