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DRPnet: automated particle picking in cryo-electron micrographs using deep regression.
Nguyen P. Nguyen
Ilker Ersoy
Jacob Gotberg
Filiz Bunyak
Tommi A. White
Published in:
BMC Bioinform. (2021)
Keyphrases
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electron micrographs
cross sections
support vector
regression model
computer aided
image analysis
least squares
image reconstruction
computer assisted
surface reconstruction