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DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In.
Wei-Chung Kao
Wei-Shun Chuang
Shiu-Ting Lin
Chien-Mo James Li
Vasco M. Manquinho
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
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pattern generation
power reduction
power consumption
low power
pattern recognition
frequency domain
discrete fourier transform
wireless ad hoc networks