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Cumulative electrostatic discharge induced degradation of power-rail ESD clamp device in high-voltage CMOS/DMOS technologies.
Chung-Ti Hsu
Shu-Chuan Chen
Yen-Hsien Chen
Yu-Ti Su
Ming-Fang Lai
Che-Hung Chen
Po-An Chen
Published in:
APCCAS (2008)
Keyphrases
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