Scenario Patterns and Trace-Based Temporal Verification of Reactive Embedded Systems.
Alice M. TokarniaEmerson P. CruzPublished in: DSD (2013)
Keyphrases
- embedded systems
- temporal patterns
- embedded devices
- low cost
- resource limited
- computing power
- real time systems
- processing power
- embedded software
- temporal information
- hardware software
- real time image processing
- embedded real time systems
- safety critical
- agent architecture
- consumer electronics
- flash memory
- communication technologies
- hw sw
- model checking
- software systems
- image processing
- real world