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An Advanced 405-nm Laser Diode Crystallization Method of a-Si Film for Fabricating Microcrystalline-Si TFTs.
Kiyoshi Morimoto
Nobuyasu Suzuki
Kazuhiko Yamanaka
Masaaki Yuri
Janet Milliez
Xinbing Liu
Published in:
IEICE Trans. Electron. (2011)
Keyphrases
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cost function
detection method
objective function
significant improvement
dynamic programming
computer simulation
similarity measure
prior knowledge
computational cost
high accuracy
clustering method
image sequences
feature extraction
computational complexity
experimental evaluation
classification accuracy