• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Discovery and Identification of Memory Corruption Vulnerabilities on Bare-Metal Embedded Devices.

Majid SalehiLuca DeganiMarco RoveriDanny HughesBruno Crispo
Published in: IEEE Trans. Dependable Secur. Comput. (2023)
Keyphrases